Single Wavelength Null Imaging Ellipsometry

Technical and Characterization Specifications:

• Null imaging ellipsometer equipped with polarizer, analyzer, compensator, objective and CCD detector.
• Single Wavelength: 532 nm, 15 mW laser source
• Motorized Goniometer:
• Angleofincidence range: 40 – 90 degree
• Angle resolution: 0.001 degree
• Absolute angle accuracy: 0.01 degree
• Speed of motion: variable, approx. 10 degree/second
• XY sample stage: Manual
• Spatial resolution (down to 2 μm).
• 10X Objective (Nikon)
• Ellipsometric precision: Delta/Psi 0.002 deg
• Absolute accuracy 0.1 deg
• Simultaneous measurement on multiple ROI.
• EP3 View software for instrument control and data collection under Windows operating system.
• Adaptation for a mini Langmuir Trough: 370mm x 75mm x 10mm
• Active vibration isolation.
• Can also serve as Brewster angle microscope (BAM) for visualizing textures and phases.