Sunday, 24 March 2019

Single Wavelength Null Imaging Ellipsometry

Single Wavelength Null Imaging Ellipsometry

Technical and Characterization Specifications:
  • Null imaging ellipsometer equipped with polarizer, analyzer, compensator, objective and CCD detector.
  • Single Wavelength: 532 nm, 15 mW laser source
  • Motorized Goniometer:
  • Angleofincidence range: 40 – 90 degree
  • Angle resolution: 0.001 degree
  • Absolute angle accuracy: 0.01 degree
  • Speed of motion: variable, approx. 10 degree/second
  • XY sample stage: Manual
  • Spatial resolution (down to 2 μm).
  • 10X Objective (Nikon)
  • Ellipsometric precision: Delta/Psi 0.002 deg
  • Absolute accuracy 0.1 deg
  • Simultaneous measurement on multiple ROI.
  • EP3 View software for instrument control and data collection under Windows operating system.
  • Adaptation for a mini Langmuir Trough: 370mm x 75mm x 10mm
  • Active vibration isolation.
  • Can also serve as Brewster angle microscope (BAM) for visualizing textures and phases.