Monday, 16 September 2019

Probe Station (CASCADE, USA):

Probe Station

Technical and Characterization Specifications:
  • Box type four and Six probe work stations.
  • Highly-precise manual probe platform for wafers and substrates upto 150mm
  • Supports a wide variety of applications such a I-V/C-V, radio frequency (RF), mm-wave and sub-THz measurements, devices and wafer characterization tests (DWC), failure analysis (FA), submicron probing, MEMS, optoelectronics engineering test.
  • Its stable platen is designed to accommodate upto sixteen positions, providing a function similar to a probe card for special wafer-level reliability (WLR) applications.
  • Associated with semi-conductor   characterization system.
  • Digital camera for live imaging