Probe Station (CASCADE, USA):
Technical and Characterization Specifications:- Box type four and Six probe work stations.
- Highly-precise manual probe platform for wafers and substrates upto 150mm
- Supports a wide variety of applications such a I-V/C-V, radio frequency (RF), mm-wave and sub-THz measurements, devices and wafer characterization tests (DWC), failure analysis (FA), submicron probing, MEMS, optoelectronics engineering test.
- Its stable platen is designed to accommodate upto sixteen positions, providing a function similar to a probe card for special wafer-level reliability (WLR) applications.
- Associated with semi-conductor characterization system.
- Digital camera for live imaging