X-ray Diffractometer [Rigaku SmartLab]

Technical and Characterization Specifications:

• Powder samples and thin films -
  • Horizontal sample mounting
• Bragg-Brentano (theta-theta) and parallel beam (grazing incidence) geometry
• Cu KAlpha line
• 3 kW X-Ray generator
• Bent/flat switchable receiving graphite monochromator
• Rotating sample plate
• 4" wafer sample plate; maximum thickness-1 mm
• Scanning range: -3 Deg-160 Deg (2theta equivalent)
• Minimum step width-0.0001 Deg.
• Variable slit widths
• Goniometer radius : 300 mm
• Scintillation counter and semiconductor detector
• Rocking curve measurement
• Automatic identification of crystal structure with PDF database
• PDXL software based refinement to obtain lattice parameters, unit cell volume
• Crystallite size and lattice strain analysis
• Global Fit XRR Reflectivity Analysis Software
• Reflectivity analysis-
  • FFT film thickness analysis function,
  • surface & interface roughness, and density analysis function by curve fitting
• Simulation function of reflectivity profile