X-ray Diffraction System

• Capillary samples (ambient and high temperature) and thin films at ambient temperature
• Horizontal sample mounting
• Transmission and grazing incidence geometries
• 3 kW X-Ray generator
• CuKalpha line beam with beam preparation optics
• Hybrid monochromator/Focussing Elliptical mirror assembly
• Soller slits before and after the sample for minimization of out-of-plane reflection
• Scanning range: 1 Deg to 140 Deg
• Minimum step width: 0.001 Deg in accumulation mode
• Variable slit widths
• Fast high resolution PIXCEL solid state multichannel detector
• Temperature range: ambient to 250 deg C, 0.1 K resolution using Mettler hot stage
• Rietveld, Stress and line-profile analysis