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मंगलवार, 19 नवम्बर 2024
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  • Seminar on Novel Lab based X-ray Spectroscopy Techniques fornon destructiveTrace Level Chemical Mapping (2D & 3D), Ultra ThinFilm Thickness Monitoring and Electronic State Characterization at Micron Resolution

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Seminar on Novel Lab based X-ray Spectroscopy Techniques fornon destructiveTrace Level Chemical Mapping (2D & 3D), Ultra ThinFilm Thickness Monitoring and Electronic State Characterization at Micron Resolution

Start: Friday, January 19, 2018   03:00pm            Place: Lecture Hall

Seminar

on

Novel Lab based X-ray Spectroscopy Techniques fornon destructiveTrace
Level Chemical Mapping (2D & 3D), Ultra ThinFilm Thickness Monitoring and
Electronic State Characterization at Micron Resolution

by

S H Lau

Vice President of Business Development, Sigray inc.

On

Friday, 19 January 2018

Time: 03.30 P.M.

Venue: Lecture Hall