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Start: Friday, January 19, 2018 03:00pm Place: Lecture Hall
Seminar
on
Novel Lab based X-ray Spectroscopy Techniques fornon destructiveTrace
Level Chemical Mapping (2D & 3D), Ultra ThinFilm Thickness Monitoring and
Electronic State Characterization at Micron Resolution
by
S H Lau
Vice President of Business Development, Sigray inc.
On
Friday, 19 January 2018
Time: 03.30 P.M.
Venue: Lecture Hall
