BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//jEvents 2.0 for Joomla//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
BEGIN:VTIMEZONE
TZID:Indian/Mahe
BEGIN:STANDARD
DTSTART:20170118T150000
RDATE:20380119T071407
TZOFFSETFROM:+0400
TZOFFSETTO:+0400
TZNAME:Indian/Mahe +04
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
UID:45f3e7ab116b4d3be9116734b2d566b7
CATEGORIES:CeNS Seminar
CREATED:20180109T102113
SUMMARY:Seminar on Novel Lab based X-ray Spectroscopy Techniques fornon destructiveTrace Level Chemical Mapping (2D & 3D), Ultra ThinFilm Thickness Monitoring and Electronic State Characterization at Micron Resolution
LOCATION:Lecture Hall
DESCRIPTION;ENCODING=QUOTED-PRINTABLE:Seminar\non\nNovel Lab based X-ray Spectroscopy Techniques fornon destructi
 veTrace\nLevel Chemical Mapping (2D & 3D), Ultra ThinFilm Thickness Mon
 itoring and\nElectronic State Characterization at Micron Resolution\nby\nS 
 H Lau\nVice President of Business Development, Sigray inc.\nOn\nFriday, 19 
 January 2018\nTime: 03.30 P.M.\nVenue: Lecture Hall\n This event was import
 ed from: https://cens.res.in/hi/about-us/people/eventdetail/166/-/seminar-o
 n-novel-lab-based-x-ray-spectroscopy-techniques-fornon-destructivetrace-lev
 el-chemical-mapping-2d-3d-ultra-thinfilm-thickness-monitoring-and-?tmpl=com
 ponent
DTSTAMP:20260408T020030Z
DTSTART;TZID=Indian/Mahe:20180119T150000
DTEND;TZID=Indian/Mahe:20180119T170000
SEQUENCE:0
TRANSP:OPAQUE
END:VEVENT
END:VCALENDAR