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TZID:Indian/Mahe
BEGIN:STANDARD
DTSTART:20150407T153000
RDATE:20380119T071407
TZOFFSETFROM:+0400
TZOFFSETTO:+0400
TZNAME:Indian/Mahe +04
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BEGIN:VEVENT
UID:28c59c6dceca2bd0a541ffe7a91c9c3c
CATEGORIES:CeNS Seminar
CREATED:20170703T072207
SUMMARY:Seminar on Advanced measurement techniques with the CSI Nano Observer scanning probe microscope
LOCATION:LECTURE HALL
DESCRIPTION;ENCODING=QUOTED-PRINTABLE:Advanced measurement techniques with the CSI Nano Observer scanning probe m
 icroscope\nby\nDr Kunal Bose\nSenior Applications Specialist & General 
 Manager\nAPAC, CS Instruments\nFrance\non\nThursday, 7 April 2016\nTime:&nb
 sp;3.30 P.M.\nVenue: Lecture Hall\n\n\n \n\n\nDr Kunal Bose, Senior Ap
 plications Specialist & General Manager APAC, CS Instruments, France\n\
 n\nRecent advances in scanning technology and digital control electronics h
 ave resulted in scanning probe microscopy techniques evolving as more affor
 dable research tools. The CSI Nano Observer™ SPM platform uses state of the
  art low voltage piezo scanning technology and high performance 24 bit digi
 tal control electronics to achieve research grade performance. In addition,
  the proprietary ResiScope II™ is a unique system able to measure Resistanc
 e over 10 decades with a high sensitivity and resolution. It can be combine
 d with several dynamic modes as MFM/EFM or KFM single pass providing severa
 l sample characterizations on the same scan area.\n\n\nThe talk will focus 
 on advanced electrical, magnetic & thermal characterization scanning pr
 obe techniques such as HD KFM, MLFM, soft Resiscope etc through a number of
  illustrative measurements obtained on a wide range of samples.\n\n\nAbout 
 the speaker:\n\n\nKunal is an experienced nano instrumentation specialist a
 nd prior to joining CSI led Agilent Technologies’ nanomeasurements business
  in South Asia. Prior to Agilent, he was an applications specialist with Ve
 eco nanotechnology (now Bruker Nano). Kunal holds Bachelors & PhD degre
 es from IIT Kharagpur & Southampton University, UK respectively and was
  a postdoctoral fellow at Leeds (UK) & Columbia University (US).\n This
  event was imported from: https://cens.res.in/en/about-us/people/eventdetai
 l/50/-/seminar-on-advanced-measurement-techniques-with-the-csi-nano-observe
 r-scanning-probe-microscope?tmpl=component
DTSTAMP:20260413T222254Z
DTSTART;TZID=Indian/Mahe:20160407T153000
SEQUENCE:0
TRANSP:OPAQUE
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