BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//jEvents 2.0 for Joomla//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
BEGIN:VTIMEZONE
TZID:Indian/Mahe
BEGIN:STANDARD
DTSTART:20150407T153000
RDATE:20380119T071407
TZOFFSETFROM:+0400
TZOFFSETTO:+0400
TZNAME:Indian/Mahe +04
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
UID:28c59c6dceca2bd0a541ffe7a91c9c3c
CATEGORIES:CeNS Seminar
CREATED:20170703T072207
SUMMARY:Seminar on Advanced measurement techniques with the CSI Nano Observer scanning probe microscope
LOCATION:LECTURE HALL
DESCRIPTION;ENCODING=QUOTED-PRINTABLE:<div style="font-family: Verdana,Helvetica,Arial,sans-serif; font-size: 16p
 x; line-height: 1.6; width: 70%; float: left; text-align: justify; margin-t
 op: 20px;"><p style="text-align: center;">Advanced measurement techniques w
 ith the CSI Nano Observer scanning probe microscope</p><p style="text-align
 : center;">by</p><p style="text-align: center;"><strong>Dr Kunal Bose</stro
 ng></p><p style="text-align: center;">Senior Applications Specialist &amp; 
 General Manager</p><p style="text-align: center;">APAC, CS Instruments</p><
 p style="text-align: center;">France</p><p style="text-align: center;">on</
 p><p style="text-align: center;">Thursday, 7 April 2016</p><p style="text-a
 lign: center;">Time:&nbsp;3.30 P.M.</p><p style="text-align: center;">Venue
 : Lecture Hall</p><p>&nbsp;</p><p><strong>Dr Kunal Bose, Senior Application
 s Specialist &amp; General Manager APAC, CS Instruments, France</strong></p
 ><p>Recent advances in scanning technology and digital control electronics 
 have resulted in scanning probe microscopy techniques evolving as more affo
 rdable research tools. The CSI Nano Observer™ SPM platform uses state of th
 e art low voltage piezo scanning technology and high performance 24 bit dig
 ital control electronics to achieve research grade performance. In addition
 , the proprietary ResiScope II™ is a unique system able to measure Resistan
 ce over 10 decades with a high sensitivity and resolution. It can be combin
 ed with several dynamic modes as MFM/EFM or KFM single pass providing sever
 al sample characterizations on the same scan area.</p><p>The talk will focu
 s on advanced electrical, magnetic &amp; thermal characterization scanning 
 probe techniques such as HD KFM, MLFM, soft Resiscope etc through a number 
 of illustrative measurements obtained on a wide range of samples.</p><p><st
 rong>About the speaker:</strong></p><p>Kunal is an experienced nano instrum
 entation specialist and prior to joining CSI led Agilent Technologies’ nano
 measurements business in South Asia. Prior to Agilent, he was an applicatio
 ns specialist with Veeco nanotechnology (now Bruker Nano). Kunal holds Bach
 elors &amp; PhD degrees from IIT Kharagpur &amp; Southampton University, UK
  respectively and was a postdoctoral fellow at Leeds (UK) &amp; Columbia Un
 iversity (US).</p></div> This event was imported from: https://cens.res.in/
 en/about-us/people/eventdetail/50/-/seminar-on-advanced-measurement-techniq
 ues-with-the-csi-nano-observer-scanning-probe-microscope?tmpl=component
DTSTAMP:20260413T222717Z
DTSTART;TZID=Indian/Mahe:20160407T153000
SEQUENCE:0
TRANSP:OPAQUE
END:VEVENT
END:VCALENDAR